E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests StdTpc-Equipment Models This Test Method applies to

This Test Method applies to all type of high purity gas delivery systems used in semiconductor manufacturing facilities and comparable research and development areas

The purpose of this Document is to provide specification for hydrogen chloride (HCl) that is used in the semiconductor industry

NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met

as when pulled down onto an ideally clean flat chuck

1  Within the semiconductor industry

E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests StdTpc-Equipment Models This Test Method applies to1 Purpose 1. 1 The purpose of this Standard is to provide a test method for measurement of mass flow controller (MFC) transient characteristics. 2 Scope 2. 1 This Standard is intended to establish a common basis for communication between users and suppliers of semiconductor equipment. It provides terminology and methodology aimed at eliminating confusion regarding what previously has been referred to as MFC response time. The conditions and procedures